Art
J-GLOBAL ID:200902209980471800   Reference number:04A0020987

Influence of sputtering conditions on the structure and properties of Ti-Si-N thin films prepared by r.f.-reactive sputtering

rf反応性スパッタリングで作製したTi-Si-N薄膜の構造と性質におよぼすスパッタリング条件の効果
Author (6):
Material:
Volume: 174/175  Page: 261-265  Publication year: Sep. 2003 
JST Material Number: D0205C  ISSN: 0257-8972  Document type: Article
Article type: 原著論文  Country of issue: Netherlands (NLD)  Language: ENGLISH (EN)
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Thesaurus term/Semi thesaurus term
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JST classification
Category name(code) classified by JST.
Thin films of other inorganic compounds 

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