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J-GLOBAL ID:200902225683257072   Reference number:05A1021563

Improvement of Thickness Uniformity of Quartz Wafer by Numerically Controlled Plasma CVM-Development of the NC-PCVM Machine and Acquisition of Machining Properties-

数値制御プラズマCVMによる水晶ウエハの高精度加工に関する研究-加工装置の開発と基本的加工特性の取得-
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Volume: 71  Issue:Page: 455-459  Publication year: Apr. 05, 2005 
JST Material Number: F0268A  ISSN: 0912-0289  Document type: Article
Article type: 原著論文  Country of issue: Japan (JPN)  Language: JAPANESE (JA)
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Manufacturing technology of solid-state devices  ,  Optical communication systems and equipment 

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