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J-GLOBAL ID:200902289684713770   Reference number:08A1026277

Specific spectral features in electron emission from nanocrystalline silicon quasi-ballistic cold cathode detected by an angle-resolved high resolution analyzer

角度分解高分解能アナライザにより検出されたナノ結晶シリコン準バリスティック冷陰極からの電子放出における特殊なスペクトル特徴
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Material:
Volume: 26  Issue:Page: 1782  Publication year: Sep. 2008 
JST Material Number: E0974A  ISSN: 1071-1023  CODEN: JVTBD9  Document type: Article
Article type: 原著論文  Country of issue: United States (USA)  Language: ENGLISH (EN)
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Category name(code) classified by JST.
Thermoionic emission and field emission  ,  Semiconductor thin films 

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