Art

J-GLOBAL ID：200902295872112644   Reference number：09A0079274

STEM像の解釈(II)

Author (2)： YAMAZAKI TAKASHI (東京理大 理) ,  WATANABE KAZUTO (東京都産業技術高専)
Material： 顕微鏡  (Microscopy)
Volume： 43  Issue： 4  Page： 278-282  Publication year： Dec. 30, 2008 
JST Material Number： Y0541A  ISSN： 1349-0958  Document type： Article
Article type： 解説  Country of issue： Japan (JPN)  Language： JAPANESE (JA)

Thesaurus term： *high resolution electron microscope ,  *scanning transmisson electron microscope ,  *structure analysis ,  quantitative analysis ,  locality ,  thermal diffuse scattering ,  electron capture ,  spherical aberration ,  aberration correction ,  space resolving power ,  SN ratio ,  chromatic aberration ,  image formation (photography) ,  focal depth ,  correcting equipment ,  *high-angle annular dark-field scanning transmission electron microscope
Semi thesaurus term： *high-angle annular dark-field scanning transmission electron microscope

JST classification (1)： Electron and ion microscopes  (BD02050B)

Reference (33)：

• 1)山崎貴司,渡辺和人:顕微鏡,43,125-129(2008)
• 2)Xu, P., Kirkland, E.J. and Silcox, J.: Ultramicrosocpy, 32,93-102(1990)
• 3)Liu, J. and Cowley, J.M.: Ultramicrosocopy, 52,335-346(1993)
• 4)Watanabe, K., Kikuchi, Y., Yamazaki, T., Asano, E., Nakanishi, N., Kotaka, Y., Okunishi, E. and Hashimoto, I.: Acta Crystallogr., Sect. A: Found. Crystallogr., 60,591-597(2004)
• 5)Wang, Z.L.: Elastic and inelastic scattering in electron diffraction and imaging, Plenum Press, New York, 1995

Terms in the title (1)： STEM