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J-GLOBAL ID:201002203662989615   Reference number:10A0375072

The relationship between IY(Y=Hα)/(I*SiH)2 and crystalline volume fraction in microcrystalline silicon growth

微結晶シリコン成長におけるI/(I*SiH)2と結晶の体積分率の関係
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Volume: 207  Issue:Page: 587-590  Publication year: Mar. 2010 
JST Material Number: D0774A  ISSN: 1862-6300  CODEN: PSSABA  Document type: Article
Article type: 原著論文  Country of issue: Germany, Federal Republic of (DEU)  Language: ENGLISH (EN)
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Semiconductor thin films  ,  Plasma diagnostics 
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