Uemura Taiki

Affiliation and department：

Research field (1)： Electronic devices and equipment

Papers (16)：

ｍore...

MISC (49)：

Taiki Uemura, Byungjin Chung, Jaehee Choi, Seungbae Lee, Shinyoung Chung, Yuchul Hwang, Sangwoo Pae. Comprehensive Study of SER in FDSOI-Planar: 28 nm to 18 nm Scaling Effect and Temperature Dependence. 2024 IEEE International Reliability Physics Symposium (IRPS). 2024
Taiki Uemura, Byungjin Chung, Jaehee Choi, Seungbae Lee, Shinyoung Chung, Yuchul Hwang, Sangwoo Pae. Soft-Error Sensitivity in SRAM Manufactured by Bulk Gate-All-Around (GAA) Technology. 2024 IEEE International Reliability Physics Symposium (IRPS). 2024
Sungman Rhee, Hyunjin Kim, Sangku Park, Taiki Uemura, Yuchul Hwang, Seungjin Choo, Jinju Kim, Hwasung Rhee, Shinyoung Chung. Machine Learning Based V-ramp V_BD Predictive Model Using OCD-measured Fab Parameters for Early Detection of MOL Reliability Risk. 2023 IEEE International Reliability Physics Symposium (IRPS). 2023
Taiki Uemura, Byungjin Chung, Shinyoung Chung, Seungbae Lee, Yuchul Hwang, Sangwoo Pae. Impact of Design and Process on Alpha-Induced SER in 4 nm Bulk-FinFET SRAM. 2023 IEEE International Reliability Physics Symposium (IRPS). 2023
Taiki Uemura, Byungjin Chung, Jegon Kim, Hyewon Shim, Shinyoung Chung, Brandon Lee, Jaehee Choi, Shota Ohnishi, Ken Machida. Accelerator-Based Thermal-Neutron Beam by Compact and Low-Cost Moderator for Soft-Error Evaluation in Semiconductor Devices. 2022 IEEE International Reliability Physics Symposium (IRPS). 2022

ｍore...

Patents (40)：

Sequential Circuit, Scan Chain Circuit Including the Same and Integrated Circuit Including the Same
Semiconductor device
Semiconductor device
Data holding circuit
Latch circuit

ｍore...

Lectures and oral presentations (6)：

[Year-in-Review] Soft Error in Planar, FDSOI, FinFET, and GAA
(IEEE International Reliability Physics Symposium (IRPS) 2023)
Future Outlook of soft-error
(Soft Error workshop in Japan 2013)
Soft-error evaluation and mitigation technologies
(Technical Committee on Integrated Circuits and Devices 2012)
Soft-Error in IC Chip for HPC
(Soft Error workshop in Japan 2012)
Soft-Error Evaluation and Mitigation
(Soft Error workshop in Japan 2011)

ｍore...

Committee career (6)：

- 現在 IEEE International Reliability Physics Symposium (IRPS) 2023-3034 Management committee
- 現在 IEEE International Reliability Physics Symposium (IRPS) 2012-2018, 2021-2024 Technical Committee (Radiation Effect)
2008 - 2022 IEEE International On-Line Testing Symposium (IOLTS) Program Committee
2014 - 2015 Silicon Errors in logic - System Effects (SELSE) Review Committee
2011 - IEEE International Conference on IC Design and Technology (ICICDT) 2011 Technical Program Committee

Show all

※ Researcher’s information displayed in J-GLOBAL is based on the information registered in researchmap. For details, see here.

Return to Previous Page