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Improved spatial resolution for spot sampling in thermal desorption atomic force microscopy - mass spectrometry via rapid heating functions
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About Somnath Suhas
About The Institute for Functional Imaging of Materials and the Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN 37831, USA. ovchinnikovo@ornl.gov
About Jesse Stephen
About Van Berkel Gary J.
About Kalinin Sergei V.
About Ovchinnikova Olga S.
Material：
About Nanoscale
Volume： 9 Issue： 17 Page： 5708-5717 Publication year： 2017
JST Material Number： W2323A ISSN： 2040-3364 CODEN： NANOHL Document type： Article
Article type： 原著論文 Country of issue： United Kingdom (GBR) Language： ENGLISH (EN)
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About desorption
About voltage
About atomic force microscope
About thermodesorption
About thin film
About crater
About ionization
About mass spectrometry
About model
About optimization
About cantilever beam
About characterization
About space resolving power
About mass spectrum
About modification
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Keywords indexed to the article.
All keywords is available on JDreamIII(charged).
On J-GLOBAL, this item will be available after more than half a year after the record posted. In addtion, medical articles require to login to MyJ-GLOBAL.
About パルス電圧
Category name(code) classified by JST.
About Atomic and molecular clusters
About Mass spectrometry
Keywords automatically extracted from the title.
About 熱脱着
About 原子間力顕微鏡法
About スポット
About サンプリング
About 空間分解能
About 急速加熱
About 関数
About 質量分析
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