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J-GLOBAL ID:201702257208412593   Reference number:17A1036876

Plane-view transmission electron microscopy of Si/GaAs interfaces fabricated by surface-activated bonding at room temperature

室温での表面活性化ボンディングにより作製したSi/GaAs界面の平面透過型電子顕微鏡観察【Powered by NICT】
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Volume: 2017  Issue: LTB-3D  Page:Publication year: 2017 
JST Material Number: W2441A  Document type: Proceedings
Article type: 原著論文  Country of issue: United States (USA)  Language: ENGLISH (EN)
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Si/GaAs interfaces fabricated ...
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Semiconductor thin films 

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