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J-GLOBAL ID:201902281222090713   Reference number:19A0400353

Local valence electronic states of silicon (sub)oxides on HfO2/Si-(sub)oxide/Si(110) and HfSi2/Si-(sub)oxide/Si(110) Islands

HfO_2/Si-(サブ)酸化物/Si(110)およびHfSi_2/Si-(サブ)酸化物/Si(110)島上のシリコン(サブ)酸化物の局所価電子状態【JST・京大機械翻訳】
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Material:
Volume: 681  Page: 9-17  Publication year: 2019 
JST Material Number: C0129B  ISSN: 0039-6028  Document type: Article
Article type: 原著論文  Country of issue: Netherlands (NLD)  Language: ENGLISH (EN)
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The effect on the local valenc...
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JST classification (5):
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Study of adsorption by physical means  ,  Salts  ,  Oxide thin films  ,  Electron spectroscopy  ,  Solid-gos interface in general. 
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