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Sano, Nobuyuki. Self-Consistent Monte Carlo Device Simulation of Capture-Excitation Processes of Carrier. 2023 International Conference on Simulation Semiconductor Processes and Devices (SISPAD2023). 2023. 1-4
S.-i. Abe, Y. Watanabe, N. Shibano, N. Sano, H. Furuta, M. Tsutsui, T. Uemura, T. Arakawa. Neutron-Induced Soft Error Analysis in MOSFETs from a 65nm to a 25 nm Design Rule using Multi-Scale Monte Carlo Simulation Method. Proc. IEEE International. Reliability Physics Symp. 2012. SE.3.1-SE.3.6
S. Abe, Y. Watanabe, N. Shibano, N. Sano, H. Furuta, M. Tsutsui, T. Uemura, T. Arakawa. Multi-scale Monte Carlo simulation of soft errors using PHITS-HyENEXSS code system. 12th Radiation and Its Effects on Components and Systems (RADECS). 2011. 390-395
2016 JOINT INTERNATIONAL EUROSOI WORKSHOP AND INTERNATIONAL CONFERENCE ON ULTIMATE INTEGRATION ON SILICON (EUROSOI-ULIS 2016)
IEEE 2016 ISBN:9781467386098
TECHNOLOGY EVOLUTION FOR SILICON NANO-ELECTRONICS
TRANS TECH PUBLICATIONS LTD 2011
2009 IEEE INTERNATIONAL ELECTRON DEVICES MEETING
IEEE 2009 ISBN:9781424456390
PHYSICA STATUS SOLIDI C - CURRENT TOPICS IN SOLID STATE PHYSICS, VOL 5, NO 1
WILEY-V C H VERLAG GMBH 2008
2007 INTERNATIONAL SEMICONDUCTOR DEVICE RESEARCH SYMPOSIUM, VOLS 1 AND 2
IEEE 2007 ISBN:9781424418916
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