2022 - 2025 MRI: Acquisition of a Plasma Focused Ion Beam System for Dynamic In-situ Micro-Mechanical Testing Over Cryogenic and Elevated Temperatures
2020 - 2025 A Systematic Dopant-selection Strategy for Advanced Manufacturing of High Strength Transparent Magnesium Aluminate Spinel
2020 - 2024 MRI: Development of a high energy-loss electron spectrometry system with improved detection sensitivity for an advanced electron microscope
Mahsa Navidirad, John E. Plumeri, Natasha Vermaak, Masashi Watanabe, Wojciech Z. Misiolek. Physical and Numerical Modeling of Micro-extrusion Behavior of AA3xxx Aluminum Alloy in Cold Roll Bonding. Lecture Notes in Mechanical Engineering. 2023. 291-298
Masashi Watanabe, Giulio Guzzinati, Pirmin Kükelhan, Volker Gerheim, Martin Linck, Heiko Müller, Max Haider, Thomas F Hoffman, Thomas Isabell, Naoki Shimura, et al. Installation of New Systems for High-Energy Electron Energy-loss Spectrometry in an Aberration-Corrected Scanning Transmission Electron Microscope. Microscopy and Microanalysis. 2023. 29. Supplement_1. 416-417
Alexander Campos-Quiros, Animesh Kundu, Masashi Watanabe. EELS Spectrum Imaging of Ca Segregation at Grain Boundaries in Magnesium Aluminate Spinel. Microscopy and Microanalysis. 2023. 29. Supplement_1. 407-408
Surui Huang, Brian Chen, Aparna Bharati, Martin P Harmer, Masashi Watanabe. Development of an Automated Reciprocal-Space Navigator in a JEOL FEMTUS Platform. Microscopy and Microanalysis. 2023. 29. Supplement_1. 728-729
MISC (3件):
M. Watanabe, G. Guzzinati, P. Kükelhan, V. Gerheim, M. Linck, H. Müller, M. Haider, T.F Hoffman, T. Isabell, N. Shimura, et al. Quantification of Oxide Materials Using a Newly Installed CEOS Energy Filtering and Imaging Device in an Aberration-corrected Scanning Transmission Electron Microscope JEM-ARM200CF. Proc. International Microscopy Congress 20. 2023
A. Campos-Quiros, A. Kundu, M. Watanabe. EELS Characterization of Y- and Ca-Doped Magnesium Aluminate Spinel. Proc. International Materials Research Congress 2023. 2023
M. Watanabe, G. Guzzinati, P. Kükelhan, V. Gerheim, M. Linck, H. Müller, M. Haider, T.F Hoffman, T. Isabell, N. Shimura, et al. A High-Energy Electron Energy-loss Spectrometry System for Advanced Analytical Electron Microscopes. Proc. International Workshop on Advanced and In-situ Microscopies of Functional Nanomaterials and Devices (IAMNano) 2023. 2023. 61-61
書籍 (1件):
Transmission Electron Microscopy: Diffraction, Imaging, and Spectrometry
Springer 2016 ISBN:3319266497
講演・口頭発表等 (11件):
材料解析のための顕微鏡ハックス
(第145回金属材料研究所講演会 2023)
Analytical Electron Microscopy: 2. Electron Energy-Loss Spectrometry (EELS)
(5th High-Resolution Electron Microscopy and Nanofabrication School at Universidade Federal Fluminense 2023)
Analytical Electron Microscopy: 1. X-ray Energy Dispersive Spectrometry (XEDS)
(5th High-Resolution Electron Microscopy and Nanofabrication School at Universidade Federal Fluminense 2023)
Quantification of Oxide Materials Using a Newly Installed CEOS Energy Filtering and Imaging Device in an Aberration-corrected Scanning Transmission Electron Microscope JEM-ARM200CF
(International Microscopy Congress 20 2023)
Installation of New Systems for High-Energy Electron Energy-loss Spectrometry in an Aberration-Corrected Scanning Transmission Electron Microscope
(Microscopy & Microanalysis 2023 2023)