Rchr
J-GLOBAL ID：200901000470752597
Update date: Sep. 23, 2024
Hirabayashi Yasuo
ヒラバヤシ ヤスオ | Hirabayashi Yasuo
Affiliation and department：
Job title：
General Technical Coordinator
Homepage URL (2)：
http://www.kistec.jp/
,
http://www.kistec.jp
Research field (5)：
Electric/electronic material engineering
, Crystal engineering
, Applied materials
, Nano/micro-systems
, Nanomaterials
Research keywords (5)：
MEMS
, マイクロマシン
, 薄膜工学
, 電子工学
, Electronic engineering and thin film engineeringMEMS
Research theme for competitive and other funds (4)：
- 2008 - 2010 半導体表面に形成したナノ周期構造による高効率紫外線光センサ
- 2008 - 2010 Electrical Characteristics of ss-FeSi_2 thin films on semi-insulating SiC substrates
- 2008 - 2009 半導体表面に形成したナノ周期構造による高効率紫外線光センサ
- マイクロエレクトロオプトメカトロニクスの作製技術、 ハードエレクトロニクス材料の作製技術
Papers (48)：
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Kengo Hamada, Tsuyoshi Ochiai, Daisuke Aoki, Yasuhisa Akutsu, Yasuo Hirabayashi. Decomposition of Gaseous Styrene Using Photocatalyst and Ozone Treatment. Catalysts. 2022. 12. 3
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Kensuke Akiyama, Teiko Kadowaki, Yasuo Hirabayashi, Hiroshi Funakubo. Effect of microstructures on electrical conduction properties of β-FeSi2 epitaxial films. Journal of Crystal Growth. 2017. 468. 744-748
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Manabu Yasui, Satoru Kaneko, Masaharu Takahashi, Takashi Sano, Yasuo Hirabayashi, Takeshi Ozawa, Ryutaro Maeda. Micro Imprinting for Al Alloy Using Ni-W Electroformed Mold. Int. J. Autom. Technol. 2015. 9. 6. 674-677
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J. Yamasaki, S. Inamoto, Y. Nomura, H. Tamaki, N. Tanaka. Atomic structure analysis of stacking faults and misfit dislocations at 3C-SiC/Si(001) interfaces by aberration-corrected transmission electron microscopy. JOURNAL OF PHYSICS D-APPLIED PHYSICS. 2014. 45. 49. 494002
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Manabu Yasui, Satoru Kaneko, Masaharu Takahashi, Hiroaki Ito, Masahiro Arai, Yasuo Hirabayashi, Takeshi Ozawa, Ryutaro Maeda. Property Variation of Ni-W Electroformed Mold for Micro-Press Molding. JAPANESE JOURNAL OF APPLIED PHYSICS. 2013. 52. 11
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MISC (90)：
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山崎順, 石田篤志, 秋山賢輔, 平林康男. Si(001)上の3C-SiCエピ膜形成および積層欠陥生成過程の断面TEM解析. 応用物理学会春季学術講演会講演予稿集(CD-ROM). 2016. 63rd
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Yamasaki J., Ishida A., Akiyama K., Hirabayashi Y. 17aAB-4 Growth process of 3C-SiC films and stacking faults on Si(001) studied by TEM. Meeting Abstracts of the Physical Society of Japan. 2015. 70. 2. 2436-2436
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Ishida A., Yamasaki J., Inamoto S., Nomura Y., Akiyama K., Hirabayashi Y., Tanaka N. 28pAM-13 Aberration corrected TEM analysis of the generation mechanism of stacking faults in 3C-SiC epitaxial films on Si(001) substrates. Meeting Abstracts of the Physical Society of Japan. 2014. 69. 1. 933-933
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山崎順, 稲元伸, 野村優貴, 石田篤志, 秋山賢輔, 平林康男, 田中信夫. 3C-SiC/Si(001)界面における積層欠陥の収差補正TEM解析. 応用物理学会春季学術講演会講演予稿集(CD-ROM). 2013. 60th
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Ishida A., Yamasaki J., Inamoto S., Nomura Y>, Akiyama K., Hirabayashi Y., Tanaka N. Analysis of stacking faults in 3C-SiC/Si(001)using aberration-corrected HRTEM. Meeting Abstracts of the Physical Society of Japan. 2013. 68. 2. 861-861
ｍore...
Books (1)：
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3C-SiC温度・光センサのための薄膜作製に関する研究
平林康男 2006
Works (1)：
-
半導体微細加工技術・マイクロマシニング技術を用いたセンサの開発等 マイクロミラーの試作
1993 - 2002
Professional career (2)：
- 理学修士 (北海道大学)
- Doctor of Engineering (Saitama University)
Work history (4)：
- 2017/04 - 現在 Kanagawa Institute of Industrial Science and Technology
- 2006/04 - 2017/03 Kanagawa Industrial Technology Center
- 1995/04 - 2006/03 Industrial Research Institute of Kanagawa Prefecture
- 1986/04 - 1995/03 Kanagawa Industrial Technology Center
Committee career (1)：
Association Membership(s) (4)：
電気学会
, 応用物理学会
, The Institute of Electrical Engineers of Japan
, The Japan Society of Applied Physics
