First-principles study on core-level XPS shift of As defects in Si crystal
(日本物理学会 第76回年次大会 2021)
超薄膜ゲルマニウムのバンド構造
(第65回応用物理学会春季学術講演会 2018)
First-principles XPS photoelectron spectroscopy analysis of arsenic and phosphorus defects in silicon crylstal
(International Conference on Defects in Semiconductors 2017)
Relaxation effect of the core-level X-ray photoelectron spectroscopy for the dopant defects in 3C-silicon carbide: a first-principles study
(International Conference on the Physics of Semiconductors 2016)