Rchr
J-GLOBAL ID:200901000470752597   Update date: Apr. 09, 2021

Hirabayashi Yasuo

ヒラバヤシ ヤスオ | Hirabayashi Yasuo
Affiliation and department:
Job title: General Manager
Homepage URL  (2): http://www.kistec.jp/http://www.kistec.jp
Research field  (5): Electric/electronic material engineering ,  Crystal engineering ,  Applied materials ,  Nano/micro-systems ,  Nanomaterials
Research keywords  (5): MEMS ,  マイクロマシン ,  薄膜工学 ,  電子工学 ,  Electronic engineering and thin film engineeringMEMS
Research theme for competitive and other funds  (4):
  • 2008 - 2010 半導体表面に形成したナノ周期構造による高効率紫外線光センサ
  • 2008 - 2010 Electrical Characteristics of ss-FeSi_2 thin films on semi-insulating SiC substrates
  • 2008 - 2009 半導体表面に形成したナノ周期構造による高効率紫外線光センサ
  • マイクロエレクトロオプトメカトロニクスの作製技術、 ハードエレクトロニクス材料の作製技術
Papers (32):
  • Manabu Yasui, Satoru Kaneko, Masaharu Takahashi, Takashi Sano, Yasuo Hirabayashi, Takeshi Ozawa, Ryutaro Maeda. Micro Imprinting for Al Alloy Using Ni-W Electroformed Mold. Int. J. Autom. Technol. 2015. 9. 6. 674-677
  • Manabu Yasui, Satoru Kaneko, Masaharu Takahashi, Hiroaki Ito, Masahiro Arai, Yasuo Hirabayashi, Takeshi Ozawa, Ryutaro Maeda. Property Variation of Ni-W Electroformed Mold for Micro-Press Molding. JAPANESE JOURNAL OF APPLIED PHYSICS. 2013. 52. 11
  • Satoru Kaneko, Takeshi Ito, Masayasu Soga, Yu Motoizumi, Manabu Yasui, Yasuo Hirabayashi, Takeshi Ozawa, Mamoru Yoshimoto. Growth of Nanocubic MgO on Silicon Substrate by Pulsed Laser Deposition. JAPANESE JOURNAL OF APPLIED PHYSICS. 2013. 52. 1
  • Takeshi Ito, Masayuki Kunimatsu, Satoru Kaneko, Yasuo Hirabayashi, Masayasu Soga, Yoshiaki Agawa, Koji Suzuki. High performance of hydrogen peroxide detection using Pt nanoparticles-dispersed carbon electrode prepared by pulsed arc plasma deposition. TALANTA. 2012. 99. 865-870
  • Satoru Kaneko, Takeshi Ito, Kensuke Akiyama, Manabu Yasui, Yasuo Hirabayashi, Masayasu Soga, Yumiko Miyake, Mamoru Yoshimoto. Nano-Cube MgO Formed on Silicon Substrate Using Pulsed Laser Deposition. JOURNAL OF NANOSCIENCE AND NANOTECHNOLOGY. 2012. 12. 3. 2320-2325
more...
MISC (82):
  • 山崎順, 石田篤志, 秋山賢輔, 平林康男. Si(001)上の3C-SiCエピ膜形成および積層欠陥生成過程の断面TEM解析. 応用物理学会春季学術講演会講演予稿集(CD-ROM). 2016. 63rd
  • Yamasaki J., Ishida A., Akiyama K., Hirabayashi Y. 17aAB-4 Growth process of 3C-SiC films and stacking faults on Si(001) studied by TEM. Meeting Abstracts of the Physical Society of Japan. 2015. 70. 2. 2436-2436
  • Ishida A., Yamasaki J., Inamoto S., Nomura Y., Akiyama K., Hirabayashi Y., Tanaka N. 28pAM-13 Aberration corrected TEM analysis of the generation mechanism of stacking faults in 3C-SiC epitaxial films on Si(001) substrates. Meeting Abstracts of the Physical Society of Japan. 2014. 69. 1. 933-933
  • 山崎順, 稲元伸, 野村優貴, 石田篤志, 秋山賢輔, 平林康男, 田中信夫. 3C-SiC/Si(001)界面における積層欠陥の収差補正TEM解析. 応用物理学会春季学術講演会講演予稿集(CD-ROM). 2013. 60th
  • Ishida A., Yamasaki J., Inamoto S., Nomura Y>, Akiyama K., Hirabayashi Y., Tanaka N. Analysis of stacking faults in 3C-SiC/Si(001)using aberration-corrected HRTEM. Meeting Abstracts of the Physical Society of Japan. 2013. 68. 2. 861-861
more...
Books (1):
  • 3C-SiC温度・光センサのための薄膜作製に関する研究
    平林康男 2006
Works (1):
  • 半導体微細加工技術・マイクロマシニング技術を用いたセンサの開発等 マイクロミラーの試作
    1993 - 2002
Professional career (2):
  • Doctor of Engineering (Saitama University)
  • 博士(工学) (埼玉大学)
Work history (4):
  • 2017/04 - 現在 Kanagawa Institute of Industrial Science and Technology
  • 2006/04 - 2017/03 Kanagawa Industrial Technology Center
  • 1995/04 - 2006/03 Industrial Research Institute of Kanagawa Prefecture
  • 1986/04 - 1995/03 Kanagawa Industrial Technology Center
Committee career (1):
  • 2006 - 2008 電気学会神奈川支所委員
Association Membership(s) (4):
電気学会 ,  応用物理学会 ,  The Institute of Electrical Engineers of Japan ,  The Japan Society of Applied Physics
※ Researcher’s information displayed in J-GLOBAL is based on the information registered in researchmap. For details, see here.

Return to Previous Page