Rchr
J-GLOBAL ID:200901004364742243
Update date: May. 17, 2020
Sato Osamu
サトウ オサム | Sato Osamu
Affiliation and department:
National Institute of Advanced Industrial Science and Technology
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Homepage URL (1):
http://www.aist.go.jp/RESEARCHERDB/cgi-bin/worker_detail.cgi?call=namae&rw_id=O23007371
MISC (5):
I. Misumi, S. Gonda, O. Sato, K. Sugawara, K. Yoshizaki, T. Kurosawa, T. Takatsuji. Nanometric lateral scale development using an atomic force microscope with directly traceable laser interferometers. MEASUREMENT SCIENCE AND TECHNOLOGY. 2006. 17. 7. 2041-2047
Interference effect in optical beam deflection detection system of dynamic AFMs and its influence on micro-profile measurement. MEASUREMENT SCIENCE & TEMHNOLOGY. 2006
QX Huang, S Gonda, Misumi, I, O Sato, T Keem, T Kurosawa. Nonlinear and hysteretic influence of piezoelectric actuators in AFMs on lateral dimension measurement. SENSORS AND ACTUATORS A-PHYSICAL. 2006. 125. 2. 590-596
マイクロ三次元幾何標準の実現方法に関する調査研究. 産総研計量標準報告. 2005. 3. 4. 559-568
O Sato, K Shimojima, R Furutani, K Takamasu. Artefact calibration of parallel mechanism, kinematic calibration with a priori knowledge. MEASUREMENT SCIENCE AND TECHNOLOGY. 2004. 15. 6. 1158-1165
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