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J-GLOBAL ID:200901069547998624   Update date: Nov. 11, 2024

Takamasu Kiyoshi

タカマス キヨシ | Takamasu Kiyoshi
Affiliation and department:
Job title: Professor
Homepage URL  (1): https://www.takamasu-lab.org
Research field  (2): Mechanics and mechatronics ,  Robotics and intelligent systems
Research keywords  (7): Traceability ,  Uncertainty Estimation ,  パラレルメカニズム ,  Nanometer Measurement ,  Coordinate Measuring Machine ,  Profile Measurement ,  Coordirate Measuring Machine
Research theme for competitive and other funds  (34):
  • 2019 - 2022 Development of the alignment monitor for muon g-2/EDM experiment
  • 2015 - 2019 Development of localized light-controlled cell-in-microfactories for the production of composite microparticle functional structures
  • 2014 - 2019 Practical application of uncertainty estimation method in three dimensional measurement for high precision of next generation three dimensional shape
  • 2015 - 2017 High Sensitive Optical Detection of Nano Particulate Defects with Autonomous Search-and-Split Liquid Probe
  • 2014 - 2016 Absolute profile measurement for large scale constrcution using comb self beat distance sensor
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Papers (343):
  • Meiyun Chen, Jinbiao Chen, Cheng Li, Qianxue Wang, Kiyoshi Takamasu. Defect detection of MicroLED with low distinction based on deep learning. Optics and Lasers in Engineering. 2024
  • Junjie He, Xiuhua Cao, Kiyoshi Takamasu, Meiyun Chen. Machine Vision-Based Lightweight Multiscale Automatic Defect Segmentation Network for MLCC. IEEE Transactions on Instrumentation and Measurement. 2024
  • Qicheng Lin, Kiyoshi Takamasu, Meiyun Chen. An Optical Lens Defect Detection Method for Micro Vision Based on WGSO-YOLO. IEEE Transactions on Instrumentation and Measurement. 2024
  • Minjie Du, Meiyun Chen, Xiuhua Cao, Kiyoshi Takamasu. Deep Learning-Based Multi-Species Appearance Defect Detection Model for MLCC. IEEE Transactions on Instrumentation and Measurement. 2024
  • Yuki Torii, Shuzo Masui, Yuki Matsumoto, Kunikazu Suzuki, Masaki Michihata, Kiyoshi Takamasu, Satoru Takahashi. Flexible Evanescent Wave Interference Lithography System for Sub-half-Wavelength Complex Relief Structures Fabrication. Nanomanufacturing and Metrology. 2021. 4. 4. 256-270
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MISC (340):
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Patents (29):
Books (1):
  • Data Processing Method for Geometrical Forms with form deviations in Coordinate Metrology(共著)
    Computer-Aided Tolerancing 1996
Works (3):
  • バーチャルCMM(三次元測定株)の国際標準化
    1999 - 2001
  • International Standard Development of Virtual CMM
    1999 - 2001
  • 物理標準の高度化に関する研究
    1997 - 2001
Education (4):
  • 1979 - 1982 The University of Tokyo
  • 1977 - 1979 The University of Tokyo
  • 1975 - 1977 The University of Tokyo The Faculty of Engineering
  • 1973 - 1975 The University of Tokyo
Professional career (1):
  • Dr. Engineering (The University of Tokyo)
Work history (6):
  • 2020/06 - 現在 The University of Tokyo
  • 2001/11 - 2020/03 東京大学大学院工学系研究科 教授
  • 1993/04 - 2001/10 東京大学大学院工学系研究科 助教授
  • 1987/10 - 1993/03 Tokyo Denki University
  • 1985/04 - 1987/09 Tokyo Denki University
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Awards (23):
  • 2019/11 - ASPEN2019 Best Paper Award Spectroscopic interferometer with a large length range by rotating diffraction grating
  • 2019/09 - 精密工学会 精密工学会賞
  • 2019/03 - Best Paper Award One-shot stereolithography for biomimetic micro hemisphere covered with relief structure
  • 2018/11 - ICPE2018 Best Paper Award Analysing tapered fiber-microsphere coupling for diameter measurement of microsphere using whispering gallery mode resonance
  • 2018/10 - 日本機械学会 生産加工・工作機械部門 優秀講演論文表彰 Whispering gallery mode共振を用いたマイクロ球直径計測-比較計測による計測精度評価-
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Association Membership(s) (7):
euspen ,  日本ロボット学会 ,  計測自動制御学会 ,  精密工学会 ,  The Society of Instrument and Control Engineers ,  The Robotics Society of Japan ,  The Japan Society for Precision Engineering
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