Rchr
J-GLOBAL ID：200901081586321020
Update date: Jul. 18, 2024
Kanemaru Seigo
カネマル セイゴウ | Kanemaru Seigo
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Affiliation and department：
National Institute of Advanced Industrial Science and Technology
About National Institute of Advanced Industrial Science and Technology
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Homepage URL (1)：
http://www.aist.go.jp/RESEARCHERDB/cgi-bin/worker_detail.cgi?call=namae&rw_id=S13564536
Research field (1)：
Electronic devices and equipment
Research keywords (1)：
電界放出 半導体 フィールドエミッションディスプレイ
Research theme for competitive and other funds (1)：
1.多機能自発光型オンチップ・ディスプレイの研究 2.FET型ナノシリコン機能デバイスの研究
MISC (42)：
M. Nagao, C. Yasumuro, S. Kanemaru, J. Itoh. Precise control of field emission current by a built-in poly-Si thin film transistor. Proceedings - International Symposium on Discharges and Electrical Insulation in Vacuum, ISDEIV. 2006. 2. 853-856
TFT制御FED. 信学技報. 2006. 106. 200. 47-52
Parameter dispersion characterization for arrays of HfC-coated emitters on poly-Si substrate. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B. 2006. 24. 2. 936-939
HfC field emitter array controlled by built-in poly-Si thin film transistor. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B. 2006. 24. 2. 1045-1051
T Matsukawa, M Masahara, H Tanoue, S Kanemaru, E Suzuki. Doping integrity diagnostics of planar transistor channel structures by scanning nonlinear dielectric microscopy. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B. 2006. 24. 1. 237-244
ｍore...
Association Membership(s) (1)：
応用物理学会
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