Art
J-GLOBAL ID：200902200940268487
Reference number：04A0442443
Intrinsic Defects in ZnO Films Grown by Molecular Beam Epitaxy
分子線エピタキシーによって成長させたZnO膜の真性欠陥
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Author (5)：
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Material：
Volume：
43
Issue：
5A
Page：
2602-2606
Publication year：
May. 15, 2004
JST Material Number：
G0520B
ISSN：
0021-4922
Document type：
Article
Article type：
原著論文
Country of issue：
Japan (JPN)
Language：
ENGLISH (EN)
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Keywords indexed to the article.
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JST classification (2)：
JST classification
Category name(code) classified by JST.
Oxide thin films
, Luminescence of semiconductors
Reference (20)：
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1) Y. Kayamura: Phys. Rev. B 38 (1988) 9797.
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2) A. Ohtomo, M. Kawasaki, Y. Sakurai, I. Ohkubo, R. Shiroki, Y. Yoshida, T. Yasuda, Y. Segawa and H. Koinuma: Mater. Sci. Eng. B 56 (1998) 263.
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3) T. Makino, C. H. Chia, Y. Segawa, M. Kawasaki, A. Ohtomo, K. Tamura, Y. Matsumoto and H. Koinuma: Appl. Surf. Sci. 189 (2002) 277.
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4) Y. Segawa, A. Ohtomo, M. Kawasaki, H. Koinuma, Z. K. Tang, P. Yu and G. K. L. Wong: Phys. Status Solidi B 202 (1997) 669.
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5) M. Joseph, H. Tabata and T. Kawai: Jpn. J. Appl. Phys. 38 (1999) L1205.
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Terms in the title (4)：
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