A Test Structure for Spectrum Analysis of Hot-Carrier-Induced Photoemission From MOSFETs

MATSUDA T; OHZONE T; ODANAKA S; YAMASHITA K; KOIKE N; TATSUUMA K

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J-GLOBAL ID：200902269315959285 Reference number：03A0394425

A Test Structure for Spectrum Analysis of Hot-Carrier-Induced Photoemission From MOSFETs

MOSFETからのホットキャリア誘起光電子放出のスペクトル解析のためのテスト構造

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Author (6)： , , , , ,
Material：
Volume： 16 Issue： 2 Page： 233-238 Publication year： May. 2003
JST Material Number： T0521A ISSN： 0894-6507 CODEN： ITSMED Document type： Article
Article type：原著論文 Country of issue： United States (USA) Language： ENGLISH (EN)

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