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J-GLOBAL ID：200902289888977815   Reference number：05A0290268

A Method for Diagnosing Multiple Fault Models based on Detecting/un-detecting Information

検出/非検出情報に基づく複数故障モデルに対する故障診断法

Author (6)： YAMASAKI AKANE (愛媛大 大学院理工学研究科) ,  SEIYAMA TETSUYA (愛媛大 大学院理工学研究科) ,  TAKAHASHI HIROSHI (愛媛大 工) ,  HIGAMI YOSHINOBU (愛媛大 工) ,  YAMAZAKI KOJI (明治大) ,  TAKAMATSU YUZO (愛媛大 工)
Material： 電子情報通信学会技術研究報告  (IEICE Technical Report (Institute of Electronics, Information and Communication Engineers))
Volume： 104  Issue： 664(DC2004 92-109)  Page： 87-92  Publication year： Feb. 11, 2005 
JST Material Number： S0532B  ISSN： 0913-5685  Document type： Proceedings
Article type： 原著論文  Country of issue： Japan (JPN)  Language： JAPANESE (JA)

Thesaurus term： *fault diagnosis ,...
Semi thesaurus term： fault simulation ,...

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JST classification (2)： Reliability  (KB04040H) ,  Measurement,testing and reliability of solid-state devices  (NC03040G)

Reference (12)：

• G-DASTIDAR, J. Fault diagnosis in scan-based bist using both time and space information. Proc. Int. Test Conf., 1999. 1999, 95-102
• JEE, A. Carafe : An inductive fault analysis tool for cmos vlsi circuits. Proc. VLSI Test Symp., 1993. 1993, 92-98
• LAVO, D. B. Multiplets, models, and the search for meaning improving per-test fault diagnosis. Proc. Int. Test Conf., 2002. 2002, 250-259
• TAKAHASHI, H. On diagnosing multiple stuck-at faults using multiple and single fault simulation in combinational circuits. IEEE Trans. on Computer-Aided Design. 2002, 21, 3, 362-368
• WANG, Z. An efficient and effective methodology on the multiple fault diagnosis. Proc. Int. Test Conf., 2003. 2003, 329-338

Terms in the title (3)： 検出情報 ,  故障モデル ,  故障診断