Rchr
J-GLOBAL ID:201801019441596155   Update date: Jun. 26, 2021

Islam Mahfuzul

イスラム マーフズル | Islam Mahfuzul
Affiliation and department:
Job title: Junior Associate Professor
Homepage URL  (1): http://mahfuz.site
Research field  (1): Electronic devices and equipment
Research keywords  (13): Flash ADC ,  Low-power ,  Power device ,  Temperature sensor ,  MOSFET ,  RTN ,  Noise ,  Order statistics ,  Variability ,  ADC ,  Sensor ,  LDO ,  VLSI
Papers (48):
  • Kensuke Murakami, Mahfuzul Islam, Hidetoshi Onodera. CDF Distance Based Statistical Parameter Extraction Using Nonlinear Delay Variation Models. 27th IEEE International Symposium on On-Line Testing and Robust System Design (IOLTS). 2021
  • Takehiro Kitamura, Mahfuzul Islam, Takashi Hisakado, Osami Wada. Flash ADC Utilizing Offset Voltage Variation With Order Statistics Based Comparator Selection. International Symposium on Quality Electronic Design (ISQED). 2021. 103-108
  • Masaki Kawamoto, Takashi Hisakado, Mahfuzul Islam, Osami Wada. Power Equalization of Peer-to-Peer Energy Transfer in Star Networks Using Broadcast from Reference Voltage Source. International Symposium on Nonlinear Theory and Its Applications. 2020
  • Teruki Someya, A.K.M. Mahfuzul Islam, Kenichi Okada. A 6.4 nW 1.7% Relative Inaccuracy CMOS Temperature Sensor Utilizing Sub-thermal Drain Voltage Stabilization and Frequency Locked Loop. IEEE Solid-State Circuits Letter. 2020. 3. 458-461
  • Hiromu Yamasaki, Koutaro Miyazaki, Yang Lo, A. K. M. Mahfuzul Islam, Katsuhiro Hata, Takayasu Sakurai, Makoto Takamiya. Power Device Degradation Estimation by Machine Learning of Gate Waveforms. International Conference on Simulation of Semiconductor Processes and Devices (SISPAD). 2020. 335-338
more...
Patents (2):
  • Reconfigurable delay circuit, delay monitor circuit using said delay circuit, variation compensation circuit, variation measurement method, and variation compensation method
  • アナログデバイスおよびその制御 方法、温度センサ、並びにアナログ 素子対応付けシステム
Books (2):
  • Dependable Embedded Systems
    Springer 2020
  • Noise in Nanoscale Semiconductor Devices
    Springer 2020
Education (1):
  • 2011 - 2014 Graduate School of Informatics, Kyoto University
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