Select basic information for advanced search
| Free word |
|---|
| Related links |  |
|---|---|
| Publisher site |  |
Development of Electrostatic-type Aberration Corrector with Annular and Circular Electrodes for SEMs
About KAWASAKI Tadahiro
About Japan Fine Ceramics Center, Nagoya, JPN
About YOSHIDA Ryuji
About Japan Fine Ceramics Center, Nagoya, JPN
About KATO Takeharu
About Japan Fine Ceramics Center, Nagoya, JPN
About NOMAGUCHI Tsunenori
About Hitachi High-Technol., Hitachinaka, JPN
About MOTOMURA Shunichi
About Hitachi High-Technol., Hitachinaka, JPN
About NISHINAKA Kenichi
About Hitachi High-Technol., Hitachinaka, JPN
About AGEMURA Toshihide
About Hitachi High-Technol., Hitachinaka, JPN
About IKUTA Takashi
About Osaka Electro-Communication Univ., Neyagawa, JPN
Material：
About AMTC Letters
Volume： 6 Page： 64-65 Publication year： Jun. 2019
JST Material Number： L7013A ISSN： 1882-9465 Document type： Proceedings
Article type： 短報 Country of issue： Japan (JPN) Language： ENGLISH (EN)
Keywords indexed to the article.
All keywords is available on JDreamIII(charged).
On J-GLOBAL, this item will be available after more than half a year after the record posted. In addtion, medical articles require to login to MyJ-GLOBAL.
About scanning electron microscope
About aberration correction
About electrode
About round shape
About morphology (form)
About Static Electricity
About cyclic
Category name(code) classified by JST.
About Electron and ion microscopes
Keywords automatically extracted from the title.
About SEM
About 環状
About 円形状
About タイプ
About 収差補正
About 開発
Return to Previous Page
