Rchr
J-GLOBAL ID：200901018951644654   Update date: Aug. 03, 2024

Endo Katsuyoshi

エンドウ カツヨシ | Endo Katsuyoshi
Affiliation and department：
Osaka University Graduate School of Engineering, Research Center for Ultra-Precision Science and Technology

About Osaka University Graduate School of Engineering, Research Center for Ultra-Precision Science and Technology


Homepage URL  (1)： http://www.prec.eng.osaka-u.ac.jp
Research field  (5)： Manufacturing and production engineering ,  Machine elements and tribology ,  Design engineering ,  Computational science ,  Applied physics - general
Research keywords  (7)： Form Measurement ,  計算機シミュレーション ,  表面物性 ,  物理計測 ,  Computational Simulation ,  Surface Science ,  Scientific Measurements
Research theme for competitive and other funds  (44)：
  • 2010 - 2014 A new high speed nano-profiler using the normal vector tracing method for next generation ultraprecision mirrors.
  • 2010 - 2011 Characterization for the atomic structures and electric structures on the GaN substrates during device fabrication process
  • 2004 - EEMプロセスの単位除去レートの向上
  • 2001 - 2003 Development of a superior PS-PDI(Phase-Shifting Point Diffraction Interferometer) for Absolute Shape Measurement of Large-Diameter Surfaces
  • 2003 - 原子論的生産技術の創出拠点
Show all
Papers (347)：
  • Y. Ohkubo, D. Fukuoka, Y. Seto, M. Nishino, K. Endo, K. Yamamura. Preparation of platinum-free manganese oxide (MnOx) catalyst film for H2O2 decomposition in contact-lens cleaning. Thin Solid Films. 2023. 782. 140041(pp.1-8)
  • E. Miyake, Y. Seto, M. Nishino, I. Komatsu, K. Endo, K. Yamamura, Y. Ohkubo. Surface modification and adhesive-free adhesion of polytetrafluoroethylene (PTFE) and silicone gel containing oleophilic SiO2 powder by plasma treatment. RSC Advances. 2023. 13. 3. 1834-1841
  • Takashi Miyawaki, Katsuyoshi Endo. Reduction of motion axis by sensitivity calibration of sensor in shape measurement instrument using normal vector tracing. Review of Scientific Instruments. 2023. 94. 015114
  • Takashi Miyawaki, Katsuyoshi Endo. Simultaneous measurement of fine pattern Shape and overall shape by a nano-profiler. Review of Scientific Instruments. 2022. 93. 125113
  • Takashi Miyawaki, Katsuyoshi Endo. Cylindrical surface shape measurement method and measurement comparison. Optical Engineering. 2022. 61. Issue 12. 124106
ｍore...
MISC (306)：
ｍore...
Patents (12)：
ｍore...
Books (6)：
  • 超精密加工と表面科学 原子レベルの生産技術
    大阪大学出版会 2014
  • Stoichiometry and Materials Science
    In Tech 2012
  • The Latest 10 Years' Progress in Mechanical Engineering
    The Japan Society of Mechanical Engineers 2007
  • 究極の物づくり-原子を操る-
    大阪大学出版会 2002
  • 超精密加工技術
    コロナ社 1998
ｍore...
Works (10)：
  • グローバルCOE 高機能化原子制御製造プロセス教育研究拠点
    2009 -
  • Center of Excellence for Atomically Controlled Fabrication Technology
    2009 -
  • 高精度X線ミラーの超精密加工と形状計測に関する研究
    2004 -
  • EEMプロセスの単位除去レートの向上
    2004 -
  • 原子論的生産技術の創出拠点
    2004 -
ｍore...
Education (5)：
  • - 1982 Osaka University
  • - 1982 Osaka University Graduate School, Division of Engineering
  • - 1980 Osaka University Faculty of Engineering
  • - 1980 Osaka University School of Engineering
  • - 1980 Osaka University Faculty of Engineering
Professional career (1)：
  • Doctor of Engineering (Osaka University)
Work history (8)：
  • 2001/06 - 現在 Osaka University Professor
  • 2001/06/01 - 現在 Osaka University Graduate School of Engineering Research Center for Ultra-Precision Science and Technology Professor
  • 2003/04 - 2008/03 附属超精密科学研究センター センター長(併)
  • 1992/04 - 2001/05 Osaka University Associate Professor
  • 1986/07 - 1992/03 Osaka University
Show all
Awards (11)：
  • 2009/03 - 社団法人精密工学会 精密工学会功労賞
  • 2006/11 - The 8th International Conference on Progress of Machining Technology Best Paper Award 2006
  • 2006/02 - 日本放射光学会 第19回日本放射光学会年会・放射光科学合同シンポジウム学生会員発表賞
  • 2006 - Best Paper Award 2006
  • 2003/03 - The Japan Society for Precision Engineering JSPE Award
Show all
Association Membership(s) (5)：
超精密加工専門委員会 ,  応用物理学会 ,  精密工学会 ,  Japan Society of Applied Physics ,  The Japan Society for Presicion Engineering
※ Researcher’s information displayed in J-GLOBAL is based on the information registered in researchmap. For details, see here.

Return to Previous Page

TOP

BOTTOM