- 2020 - 現在 JST 創発的研究支援事業 創発アドバイザー
- 2018/06 - 現在 Technical Group on Dependable Computing, IEICE Member
- 2018 - 現在 CREST [コンピューティング基盤]Society5.0を支える革新的コンピューティング技術 領域アドバイザー
- 2016/06 - 現在 文部科学省国立大学法人評価員会大学共同利用機関法人分科会 専門委員
- 2014/10 - 現在 Science Council of Japan Member
- 2014 - 現在 Steering Committee, IEEE Asian Test Symposium Member
- 2023/06 - 2025/06 Information Processing Society of Japan Director
- 2023/01 - 2024/12 IEEE Japan Council WIE Coordinator
- 2023/01 - 2024/12 IEEE Japan Council Committee member
- 2021/06 - 2022/06 Kansai Section, IEICE Chair
- 2017 - 2019 Steering Committee, IEEE Asian Test Symposium Chair
- 2016/06 - 2018/06 Technical Group on Dependable Computing, IEICE Japan Chair
- 2016/01 - 2017/12 Women In Engineering Affinity Group, IEEE Kansai Section Vice Chair
- 2014/05 - 2016/05 Technical Group on Dependable Computing, IEICE Japan Vice Chair
- 2014/01 - 2015/12 Women In Engineering Affinity Group, IEEE Kansai Section Chair
- 2006/05 - 2014/06 Technical Group on Dependable Computing, IEICE Member
- 2009/05 - 2013/05 IEICE Transactions D (Japanese Edition) Editorial member
- 2009/01 - 2012/12 Student Activities Committee, IEEE Kansai Section Member
- 2002/05 - 2008/05 Technical Group on Computation Member
- 2007/03 - 2008/03 Special Issue on Test and Verification of VLSI, IEICE Trans. on Information and Systems, IEICE Japan Guest Editor
- 2003/05 - 2005/05 IPSJ, Kansai section Secretary
- 2002 - 2004 JSPS Secretary, Kansai Section
- 1999/05 - 2003/05 Technical Group on Algorithm, IPS Japan Member
- Workshop on RTL and High Level Testing 2004 Finance Chair
- 2nd IEEE Workshop on RTL ATPG & DFT 2001 Local Arrangement Chair
- IEEE European Test Symposium 2019 Publicity Chair
- IEEE European Test Symposium 2018 Publicity Chair
- IEEE European Test Symposium 2017 Publicity Chair
- 11th IEEE Asian Test Symposium 2002 Publication Chair
- IEEE Asian Test Symposium 2008 Tutorial Chair
- IEEE Workshop on RTL and High Level Testing 2011 Program Co-Chair
- IEEE Workshop on RTL and High Level Testing 2006 Program Chair
- IEEE International Workshop on Reliability Aware System Design and Test 2014 Vice General Co-Chair
- IEEE International Workshop on Reliability Aware System Design and Test 2013 Vice General Co-Chair
- IEEE International Workshop on Reliability Aware System Design and Test 2012 Vice General Co-Chair
- IEEE International Workshop on Reliability Aware System Design and Test 2011 Vice General Co-Chair
- IEEE International Workshop on Reliability Aware System Design and Test 2010 Vice General Co-Chair
- IEEE Workshop on RTL and High Level Testing 2012 Vice General Chair
- International Conference on VLSI Design 2014 Track Co-Chair
- IEEE Asian Test Symposium 2015 General Co-Chair
- IEEE Workshop on RTL and High Level Testing 2016 General Chair
- Organizing Committee, IEEE MAW Kansai 2016 Member
- Workshop on RTL and High Level Testing 2004 Finance Chair
- 2nd IEEE Workshop on RTL ATPG & DFT 2001 Local Arrangement Chair
- IEEE European Test Symposium 2019 Publicity Chair
- IEEE European Test Symposium 2018 Publicity Chair
- IEEE European Test Symposium 2017 Publicity Chair
- 11th IEEE Asian Test Symposium 2002 Publication Chair
- IEEE Asian Test Symposium 2008 Tutorial Chair
- IEEE Workshop on RTL and High Level Testing 2011 Program Co-Chair
- IEEE Workshop on RTL and High Level Testing 2006 Program Chair
- IEEE International Workshop on Reliability Aware System Design and Test 2014 Vice General Co-Chair
- IEEE International Workshop on Reliability Aware System Design and Test 2013 Vice General Co-Chair
- IEEE International Workshop on Reliability Aware System Design and Test 2012 Vice General Co-Chair
- IEEE International Workshop on Reliability Aware System Design and Test 2011 Vice General Co-Chair
- IEEE International Workshop on Reliability Aware System Design and Test 2010 Vice General Co-Chair
- IEEE Workshop on RTL and High Level Testing 2012 Vice General Chair
- International Conference on VLSI Design 2014 Track Co-Chair
- IEEE Asian Test Symposium 2015 General Co-Chair
- IEEE Workshop on RTL and High Level Testing 2016 General Chair
- Organizing Committee, IEEE MAW Kansai 2016 Member
