Rchr
J-GLOBAL ID:200901090855732235
Update date: Aug. 24, 2021
Yoshida Sadafumi
ヨシダ サダフミ | Yoshida Sadafumi
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Homepage URL (1):
http://www.opt.ees.saitama-u.ac.jp/~yoshida/yoshi.html
Research field (4):
Electronic devices and equipment
, Electric/electronic material engineering
, Crystal engineering
, Applied materials
Research theme for competitive and other funds (4):
窒化物半導体の結晶成長と物性評価
炭化珪素半導体のデバイス化プロセス基礎技術の研究
Crystal Growth and Characterization of Nitride Semiconductors
Study on the basic of the process technologies for silicon carbide devices
MISC (8):
"Measurements of the Depth Profile of the Refractive Incices in Oxide Films on SiC by Spectroscopic Ellipsometry. Japanese Journal of Applied Physics. 2002. 41. 2A. 800-804
Takeshi Iida, Yuichi Tomioka, Kazuo Yoshimoto, Masahiko Midorikawa, Hiroyuki Tukada, Misao Orihara, Yasuto Hijikata, Hiroyuki Yaguchi, Masahito Yoshikawa, Hisayoshi Itoh, et al. "Measurements of the Depth Profile of the Refractive Incices in Oxide Films on SiC by Spectroscopic Ellipsometry. Japanese Journal of Applied Physics. 2002. 41. 2A. 800-804
S Yoshida. Growth of cubic III-nitride semiconductors for electronics and optoelectronics application. PHYSICA E. 2000. 7. 3-4. 907-914
“Optical constants of cubic GaN, AlN, and AlGaN alloys”. Japanese Journal of Applied Physics. 2000. 39. L497-499
IIDA T, TOMIOKA Y, HIJIKATA Y, YAGUCHI H, YOSHIKAWA M, ISHIDA Y, OKUMURA H, YOSHIDA S. “Characterization of Oxide Films on SiC by Spectroscopic Ellipsometry”. Japanese Journal of Applied Physics,. 2000. 39. 10B. L1054-L1056
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Books (4):
SiC素子の基礎と応用
オーム社 2003
“Epitaxial Growth, Characterization, and Properties of SiC” in Electric Refractory Materials
Marcell Dekker, Inc. 2000
“Epitaxial Growth, Characterization, and Properties of SiC” in Electric Refractory Materials
Marcell Dekker, Inc. 2000
「薄膜」
培風館 1990
Works (2):
分光偏光解析等によるSiC酸化層の評価
1998 -
Characterization of SiC/oxide interfaces by spectroscopic ellipsometry
1998 -
Education (6):
- 1972 The University of Tokyo
- 1972 The University of Tokyo Graduate School, Division of Engineering
- 1969 The University of Tokyo
- 1969 The University of Tokyo Graduate School, Division of Engineering
- 1967 The University of Tokyo The Faculty of Engineering
- 1967 The University of Tokyo Faculty of Engineering
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Professional career (2):
工学修士 (東京大学)
工学博士 (東京大学)
Work history (6):
1973 - 1997 通商産業省工業技術院電子技術総合研究所
1973 - 1997 Electrotechnical Laboratory, AIST, MITI
1997 - - 埼玉大学工学部教授
1997 - - Professor, Faculty of Engineering, Saitama University
1972 - 1973 The University of Tokyo The Faculty of Engineering
1972 - 1973 Research Associate, Faculty of Engineering, University of Tokyo
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Awards (1):
1992 - 市村学術貢献賞
Association Membership(s) (3):
応用物理学会(常務理事1993-5,評議員1996-,SiC及び関連ワイドギャップ半導体研究会代表幹事1995-1997)
, 電気学会
, 真空協会(理事1997-)
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