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J-GLOBAL ID：201001009936362873 Update date: Dec. 18, 2024

Miyase Kouhei

ミヤセコウヘイ | Miyase Kouhei

Affiliation and department：
Job title： Associate Professor

Research field (2)： Information networks , Computer systems

MISC (94)：

Yucong Zhang, Stefan Holst, Xiaoqing Wen, Kohei Miyase, Seiji Kajihara, Jun Qian. Scan chain grouping for mitigating ir-drop-induced test data corruption. Proceedings of the Asian Test Symposium. 2018. 140-145
Lu S, Li H, Miyase K. Adaptive ECC Techniques for Reliability and Yield Enhancement of Phase Change Memory. 2018 IEEE 24th International Symposium on On-Line Testing and Robust System Design, IOLTS 2018. 2018. 226-227
Adaptive ECC Techniques for Reliability and Yield Enhancement of Phase Change Memory. 2018. 226-227
Stefan Holst, Eric Schneider, Koshi Kawagoe, Michael A. Kochte, Kohei Miyase, Hans-Joachim Wunderlich, Seiji Kajihara, Xiaoqing Wen. Analysis and mitigation or IR-Drop induced scan shift-errors. Proceedings - International Test Conference. 2017. 2017-. 1-8
K. Miyase, Y. Kawano, X. Wen, S. Kajihara. Locating Hot Spot with Justification Techniques in a Layout Design. IEEE Workshop on RTL and High Level Testing. 2017

Professional career (1)：

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