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J-GLOBAL ID：202301016190769030   Update date: May. 28, 2024

Tomiya Shigetaka

トミヤ シゲタカ | Tomiya Shigetaka
Affiliation and department：
Nara Institute of Science and Technology Data Science Center

About Nara Institute of Science and Technology Data Science Center


Job title： professor
Other affiliations (1)：
Research field  (4)： Applied materials ,  Crystal engineering ,  Thin-film surfaces and interfaces ,  Inorganic materials
Research keywords  (1)： 半導体材料物性、半導体デバイス、材料解析技術、計測インフォマティクス
Research theme for competitive and other funds  (1)：
  • 2022 - 2025 Growth mechanism and thermoelectric conversion property of transition metal dichalcogenides thin films
Papers (56)：
  • Tatsuya Kitazawa, Yuta Inaba, Shunsuke Yamashita, Shinya Imai, Keita Kurohara, Tetsuya Tatsumi, Hitoshi WAKABAYASHI, Shigetaka Tomiya. Impact of crystallinity on thermal conductivity of RF magnetron sputtered MoS2 thin films. Japanese Journal of Applied Physics. 2024
  • Yudai Yamaguchi, Yuta Inaba, Ryoji Arai, Yuya Kanitani, Yoshihiro Kudo, Michinori Shiomi, Daiji Kasahara, Mikihiro Yokozeki, Noriyuki Fuutagawa, Jun Uzuhashi, et al. Atomic-Scale Multimodal Characterization of Self-Assembled InAs/InGaAlAs Quantum Dots. Journal of Physical Chemistry Letters. 2024. 15. 14. 3772-3778
  • Keito Mori-Tamamura, Yuchi Takahashi, Shigeta Sakai, Yuya Morimoto, Junji Hirama, Atsushi A. Yamaguchi, Susumu Kusanagi, Yuya Kanitani, Yoshihiro Kudo, Shigetaka Tomiya. Absolute evaluation of internal and external quantum efficiencies and light extraction efficiency in InGaN single quantum wells by simultaneous photoacoustic and photoluminescence measurements combined with integrating-sphere method. Science and Technology of Advanced Materials: Methods. 2024. 4. 1
  • Shinya Imai, Ryosuke Kajikawa, Takamasa Kawanago, Iriya Muneta, Kazuo Tsutsui, Tetsuya Tatsumi, Shigetaka Tomiya, Kuniyuki Kakushima, Hitoshi Wakabayashi. Reduction of contact resistance to PVD-MoS film using aluminum-scandium alloy (AISc) edge contact. IEEE Electron Devices Technology and Manufacturing Conference: Strengthening the Globalization in Semiconductors, EDTM 2024. 2024
  • Keita Kurohara, Shinya Imai, Takuya Hamada, Tetsuya Tatsumi, Shigetaka Tomiya, Kuniyuki Kakushima, Kazuo Tsutsui, Hitoshi Wakabayashi. Conductivity Enhancement of PVD-WS2 Films Using Cl2-Plasma Treatment Followed by Sulfur-Vapor Annealing. IEEE Journal of the Electron Devices Society. 2024
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MISC (44)：
  • 神野翔綺, 山口敦史, 森恵人, 草薙進, 蟹谷裕也, 冨谷茂隆, 工藤喜弘. Simultaneous microscopic PA/PL line-scan measurements in InGaN-quantum wells on a stripe-core GaN Substrate. 電子情報通信学会技術研究報告(Web). 2023. 123. 288(ED2023 14-37)
  • Okamoto Kazuya, Sugiyama Masaaki, Muto Shunsuke, Aoyagi Satoka, Tomiya Shigetaka. Advanced Measurement and Analysis Systems Using AI/ML for Next Generation Materials Development-Multifaceted View 2-. Materia Japan. 2022. 61. 9. 579-587
  • Okamoto Kazuya, Sugiyama Masaaki, Muto Shunsuke, Aoyagi Satoka, Tomiya Shigetaka. Advanced Measurement and Analysis Systems Using AI/ML for Next Generation Materials Development -Multifaceted View 1-. Materia Japan. 2022. 61. 8. 470-478
  • Toyama Satoko, Seki Takehito, Kanitani Yuya, Tomiya Shigetaka, Ikuhara Yuichi, Shibata Naoya. The Observation of Local Electric Fields in GaN/AlGaN/InGaN Multi-heterostructures by Differential Phase Contrast STEM. IEEJ Transactions on Electronics, Information and Systems. 2022. 142. 3. 367-372
  • 冨谷 茂隆. 計測インフォマティクス : 計測は科学の源-特集 データ駆動型の化学 : 何ができて,何ができない?. 現代化学 = Chemistry today. 2022. 612. 25-28
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Patents (85)：
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Professional career (1)：
  • Ph.D. in Engineering (Keio University)
Committee career (7)：
  • 2023/04 - 現在 日本学術振興会 R031ハイブリッド量子ナノ技術委員会 材料分科主査
  • 2022/04 - 現在 NEDO 国立研究開発法人 新エネルギー・産業技術総合開発機構 技術委員
  • 2022/04 - 現在 応用物理学会 インフォマティクス応用研究会 副委員長
  • 2022/04 - 現在 日本学術振興会 R026先端計測技術の将来設計委員会 幹事
  • 2013/04 - 現在 電子材料シンポジウム 運営委員
Show all
Awards (1)：
  • 2021/09 - The Japan Society of Applied Physics JSAP Fellow Study on Defects and Degradation Mechanisms in Wide-bandgap Compound Semiconductor Optical Devices
Association Membership(s) (2)：
The Japanese Society of Microscopy ,  The Japan Society of Applied Physics
※ Researcher’s information displayed in J-GLOBAL is based on the information registered in researchmap. For details, see here.

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