Rchr
J-GLOBAL ID:200901048710098442
Update date: Jan. 17, 2024
Kuji Norio
クジ ノリオ | Kuji Norio
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Research field (2):
Measurement engineering
, Electronic devices and equipment
Research keywords (8):
RFID
, センサネットワーク
, LSI
, 故障診断
, RFID
, Sensor Network
, LSI
, Fault Diagnosis
Research theme for competitive and other funds (8):
2003 - センサネットワークの高度化の研究
2003 - デジタル・アナログ混在集積回路の故障診断法の研究
2003 - Research on sophisticated sensor network
2003 - Reasearch on fault diagnostic method of mixed-signal LSIs
センサネットワークの高度化の研究
デジタル・アナログ混在集積回路の故障診断法の研究
Research on sophiscated sensor network
Reasearch on fault diagnosis of mixed-signal LSIs.
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MISC (12):
EBテストパッド配置比率の向上手法. 電子情報通信学会論文誌C. 2002. J85-C. 4. 293-299
EB Testing-Pad Method and its Evaluation by Actual Devices. IEICE Trans, Inf. && Syst. 2002. E85-D. 10. 1558-1563
LSIの回路修正容易化設計. 電子情報通信学会論文誌C. 2001. J84-C. 11. 1106-1112
N Kuji, T Takeda. Improvement of E-beam observability by testing-pad placement in LSI design layout. IEICE TRANSACTIONS ON ELECTRONICS. 1999. E82C. 2. 387-392
Guided-Probe Diagnosis of LSIs Containing Macrocells. IEICE Trans. Inf. && Syst. 1998. E81-D. 7. 731-737
more...
Patents (3):
半導体集積回路のレイアウト設計方法および記録媒体
半導体集積回路、レイアウト設計装置、レイアウト設計方法およびその記録媒体
観測パッド及びその配置手法
Education (4):
- 1975 Tohoku University
- 1975 Tohoku University Graduate School, Division of Engineering Electronics
- 1973 Tohoku University Faculty of Engineering
- 1973 Tohoku University Faculty of Engineering Electronics
Professional career (1):
Doctor(Engineering) (Tohoku University)
Awards (1):
日本電信電話(株)研究開発本部長賞 論文賞
Association Membership(s) (2):
IEEE
, IEEE
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