Art
J-GLOBAL ID：200902151107213457   Reference number：98A0737207

Test and Diagnosis of VLSI. Guided Probe Diagnosis of LSls Containing Macrocells.

マイクロセルを含むLSIのプローブガイド診断
Author (2)：
KUJI N

About KUJI N

(Nippon Telegraph and Telephone Corp., Atsugi-shi, JPN)

About Nippon Telegraph and Telephone Corp., Atsugi-shi, JPN

, 
TAKEDA T

About TAKEDA T

(Nippon Telegraph and Telephone Corp., Atsugi-shi, JPN)

About Nippon Telegraph and Telephone Corp., Atsugi-shi, JPN


Material：
IEICE Transactions on Information and Systems (Institute of Electronics, Information and Communication Engineers)  (IEICE Trans Inf Syst (Inst Electron Inf Commun Eng))

About IEICE Transactions on Information and Systems (Institute of Electronics, Information and Communication Engineers)


Volume： E81-D  Issue： 7  Page： 731-737  Publication year： Jul. 1998 
JST Material Number： L1371A  ISSN： 0916-8532  Document type： Article
Article type： 原著論文  Country of issue： Japan (JPN)  Language： ENGLISH (EN)
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*circuit test

About circuit test

,...
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JST classification (1)：
JST classification
Category name(code) classified by JST.
Measurement,testing and reliability of solid-state devices 
(NC03040G)

About Measurement,testing and reliability of solid-state devices

Terms in the title (3)：
Terms in the title
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マイクロセル

About マイクロセル

, 
LSI

About LSI

, 
診断

About 診断


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