Study of Soft Breakdown in Thin SiO2 Films by Carrier-Separation Technique and Breakdown-Transient Modulation, The Physics and Chemistry of SiO2 and The Si-SiO2 Interface-4
The Electrochemical Society, Inc 2000
Works (3):
US Patent #5,754,077 Semiconductor Integrated Circuit Having Plural Functional Blocks
1998 -
US Patent #5,679,961 Correlation Tunnel Device
1997 -
US Pateut #5,463,234 High Speed Simiconductor Gain Memory Cell with Mininal Area Occupancy
1995 -
Education (4):
- 1983 The University of Tokyo
- 1983 The University of Tokyo Graduate School, Division of Engineering
- 1978 The University of Tokyo Faculty of Science
- 1978 The University of Tokyo Faculty of Science
Professional career (1):
(BLANK)
Awards (1):
1997 - 米国電気・電子技術者協会信頼性物理シンポジウム最優秀論文賞 (IEEE Int.Reliability Physics Symposium, Best Paper Award
Association Membership(s) (4):
アメリカ物理学会(Americal Physical Society)
, 米国電気・電子技術者協会(The Institute of Electrical & Electronics Engineers)
, 日本物理学会
, 応用物理学会