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J-GLOBAL ID:200902254348264358   Reference number:06A0540528

Improvement of Thickness Uniformity of Quartz Crystal Wafer by Numerically Controlled Plasma CVM-Correction of Thickness Distribution of Quartz Crystal Wafer by Numerically Controlled Machining Utilizing Pipe Electrode-

数値制御プラズマCVMによる水晶ウエハの高精度加工に関する研究-回転電極とパイプ電極を併用した数値制御加工による水晶ウエハ厚さの均一化-
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Volume: 72  Issue:Page: 934-938  Publication year: Jul. 05, 2006 
JST Material Number: F0268B  ISSN: 1348-8716  Document type: Article
Article type: 原著論文  Country of issue: Japan (JPN)  Language: JAPANESE (JA)
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Manufacturing technology of solid-state devices  ,  Special machining 
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