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J-GLOBAL ID:201802223682515100   Reference number:18A2209512

Thermal stability of silicon and nitrogen doped DLC thin films

ケイ素及び窒素を添加したDLC薄膜の熱的安定性
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Volume: 118  Issue: 276(CPM2018 41-53)  Page: 99-104  Publication year: Oct. 25, 2018 
JST Material Number: S0532B  ISSN: 0913-5685  Document type: Proceedings
Article type: 原著論文  Country of issue: Japan (JPN)  Language: JAPANESE (JA)
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Semiconductor thin films 
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