AKIMOTO Koichi

アキモトコウイチ | AKIMOTO Koichi

Affiliation and department：
Job title： Professor

Research field (3)： Semiconductors, optical and atomic physics , Crystal engineering , Thin-film surfaces and interfaces

Research keywords (2)： X-ray diffraction , Surface and interface physics

Research theme for competitive and other funds (13)：

2015 - 2018 Study on strain fields and surface reconstructions of GaN crystals which have microstructure in mesoscopic scale.
2013 - 2016 Analysis of precise electron density of topological insulator thin films by applying direct methods to surface X-ray diffraction
2012 - 2015 Study on strain fields of GaN crystals which have microstructures in mesoscopic scale.
2011 - 2013 Study on the correlation between the behavior of a soft metal layer at frictional interface and its tribological properties
2009 - 2011 Study on crystal grains of GaN which has microstructures in mesoscopic scale.

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Papers (94)：

AKIMOTO Koichi. Polarity Determination of GaN Thin Films by Anomalous X-Ray Diffraction. X-RAYS. 2015. 57. 5. 263-268
A. Ruammaitree, H. Nakahara, K. Akimoto, K. Soda, Y. Saito. Determination of non-uniform graphene thickness on SiC (0001) by X-ray diffraction. APPLIED SURFACE SCIENCE. 2013. 282. 297-301
Koichi Akimoto, Takashi Emoto. Quantitative strain analysis of surfaces and interfaces using extremely asymmetric x-ray diffraction. JOURNAL OF PHYSICS-CONDENSED MATTER. 2010. 22. 47. 473001
Wolfgang Voegeli, Toru Takayama, Tetsuroh Shirasawa, Makoto Abe, Kimitaka Kubo, Toshio Takahashi, Koichi Akimoto, Hiroshi Sugiyama. Structure of the quasi-one-dimensional Si(553)-Au surface: Gold dimer row and silicon honeycomb chain. Physical Review B - Condensed Matter and Materials Physics. 2010. 82. 7
Wolfgang Voegeli, Tomohiro Aoyama, Koichi Akimoto, Ayahiko Ichimiya, Yoshiyuki Hisada, Yoshihito Mitsuoka, Shinichi Mukainakano. Structure of the SiC(0001)-√3 ×√3-R30° surface after initial oxidation. Surface Science. 2010. 604. 19-20. 1713-1717

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MISC (1)：

Sumitani K, Zhang X, Kawata H, Sakata O, Tajiri H, Masuzawa K, Yoshida R, Hoshino T, Nakatani S, Takahashi T, et al. 26pXC-4 Three-dimensional study on Si(111)-6×1(3×1)-Ag surface structure using surface x-ray diffraction. Meeting Abstracts of the Physical Society of Japan. 2005. 60. 0

Patents (8)：

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Books (5)：

Lectures and oral presentations (14)：

22pGQ-2 Atomic structure of the Si(553)-Au surface
(Meeting abstracts of the Physical Society of Japan 2010)
22aXJ-10 Structural changes in the SiC(0001)-3×3 and (√<3>×√<3>)-R30°reconstructions due to exposure to oxygen
(Meeting abstracts of the Physical Society of Japan 2007)
26pXC-4 Three-dimensional study on Si(111)-6×1(3×1)-Ag surface structure using surface x-ray diffraction
(Meeting Abstracts of the Physical Society of Japan 2005)
Development of a manipulator for surface X-ray diffraction measurement at low temperature and study of the Si(111)-6x1-Ag surface
(Meeting abstracts of the Physical Society of Japan 2003)
Structural Study of SiC(0001)3×3 Surface by Surface X-Ray Diffraction
(Meeting abstracts of the Physical Society of Japan 2002)

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Education (2)：

1980 - 1985 The University of Tokyo The Graduate School of Engineering Department of Applied Physics
1976 - 1980 The University of Tokyo Faculty of Engineering Department of Applied Physics

Professional career (1)：

Work history (7)：

2022/04 - 現在 Japan Women's University Graduate School of Science Dean
2012/04 - 現在 Japan Women's University Faculty of Science Professor
2023/04 - 2024/03 Japan Women's University Executive Director, Advisor to the President
2022/04 - 2024/03 Japan Women's University Member of the Education and Research Council
1994 - 2012 Nagoya University Graduate School of Engineering Associate Professor

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Committee career (1)：

Awards (1)：

Association Membership(s) (4)：

日本表面真空学会 , 日本物理学会 , 応用物理学会 , American Physical Society

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