Research field (3)：
Semiconductors, optical and atomic physics
, Crystal engineering
, Thin-film surfaces and interfaces
Research keywords (2)：
X-ray diffraction
, Surface and interface physics
Research theme for competitive and other funds (13)：
2015 - 2018 Study on strain fields and surface reconstructions of GaN crystals which have microstructure in mesoscopic scale.
2013 - 2016 Analysis of precise electron density of topological insulator thin films by applying direct methods to surface X-ray diffraction
2012 - 2015 Study on strain fields of GaN crystals which have microstructures in mesoscopic scale.
2011 - 2013 Study on the correlation between the behavior of a soft metal layer at frictional interface and its tribological properties
2009 - 2011 Study on crystal grains of GaN which has microstructures in mesoscopic scale.
2007 - 2009 Study on structural changes of solid surfaces due to tribological interaction in sliding interfaces
2006 - 2008 イオンビームによるシリコン表面界面におけるナノ構造の形成と制御
2004 - 2006 Phase transition of high-dielectric insulating films studied by extremely asymmetric X-ray diffraction and X-ray photoelectron spectroscopy
2004 - 2006 Study on the one-dimensional structure of metals on semiconductor surfaces and buried interfaces
2001 - 2004 軌道放射光を用いたシリコン/高誘電率絶縁膜界面の構造解析
2001 - 2003 Relaxation processes of nano structures on semiconductor surfaces.
2000 - 2002 Strain Relaxation at Semiconductor Surface Revealed by X-Ray Diffraction
1995 - 1996 Dynamic Processes in Atomic Level on Silicon Surfaces
Sumitani K, Zhang X, Kawata H, Sakata O, Tajiri H, Masuzawa K, Yoshida R, Hoshino T, Nakatani S, Takahashi T, et al. 26pXC-4 Three-dimensional study on Si(111)-6×1(3×1)-Ag surface structure using surface x-ray diffraction. Meeting Abstracts of the Physical Society of Japan. 2005. 60. 0
22pGQ-2 Atomic structure of the Si(553)-Au surface
(Meeting abstracts of the Physical Society of Japan 2010)
22aXJ-10 Structural changes in the SiC(0001)-3×3 and (√<3>×√<3>)-R30°reconstructions due to exposure to oxygen
(Meeting abstracts of the Physical Society of Japan 2007)
26pXC-4 Three-dimensional study on Si(111)-6×1(3×1)-Ag surface structure using surface x-ray diffraction
(Meeting Abstracts of the Physical Society of Japan 2005)
Development of a manipulator for surface X-ray diffraction measurement at low temperature and study of the Si(111)-6x1-Ag surface
(Meeting abstracts of the Physical Society of Japan 2003)
Structural Study of SiC(0001)3×3 Surface by Surface X-Ray Diffraction
(Meeting abstracts of the Physical Society of Japan 2002)
