Pat
J-GLOBAL ID:202303020240614428

半導体装置とその製造方法

Inventor:
Applicant, Patent owner:
Agent (1): 弁理士法人 快友国際特許事務所
Gazette classification:特許公報
Application number (International application number):2020021850
Publication number (International publication number):2021127262
Patent number:7315927
Application date: Feb. 12, 2020
Publication date: Sep. 02, 2021
Claim (excerpt):
【請求項1】 半導体装置の製造方法であって、 ミストCVD法によって、Ga2-xFexO3(0 IPC (9):
C30B 29/16 ( 200 6.01) ,  C30B 25/18 ( 200 6.01) ,  C23C 16/40 ( 200 6.01) ,  H01L 21/365 ( 200 6.01) ,  H01L 29/24 ( 200 6.01) ,  H01L 21/338 ( 200 6.01) ,  H01L 29/778 ( 200 6.01) ,  H01L 29/812 ( 200 6.01) ,  H01L 21/368 ( 200 6.01)
FI (7):
C30B 29/16 ,  C30B 25/18 ,  C23C 16/40 ,  H01L 21/365 ,  H01L 29/24 ,  H01L 29/80 H ,  H01L 21/368 Z
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