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J-GLOBAL ID：201801012018817825
Update date: Feb. 03, 2025 Tachizaki Takehiro
Tachizaki Takehiro
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Tokai University School of Information Science and Technology Department of Applied Computer Engineering
About Tokai University School of Information Science and Technology Department of Applied Computer Engineering
Homepage URL (1)： http://aom.eh.u-tokai.ac.jp/
Research field (5)：
Semiconductors, optical and atomic physics
, Optical engineering and photonics
, Optical engineering and photonics
, Thin-film surfaces and interfaces
, Thin-film surfaces and interfaces
Research keywords (21)：
半導体
, ラマン分光
, optical microscopy
, Measurement system
, optical physics
, thin films
, terahertz
, surfaces and interfaces
, quantum well
, optica interferometer
, phase change material
, time-resolved spectroscopy
, intense terahertz
, coherent phonon
, ultrasonics
, magnetic force microscopy
, atomic force microscopy
, Scanning near-field optical microscopy
, near-field optics
, Scanning probe microscopy
, Optica metlorogy
Research theme for competitive and other funds (1)： - 2006 - 2007 三次元光走査技術の新規開発とそれを用いたサブピコ秒オーダー超高速現象の実時間観察
- Zhenya Zhang, Minoru Kanega, Kei Maruyama, Takayuki Kurihara, Makoto Nakajima, Takehiro Tachizaki, Masahiro Sato, Yoshihiko Kanemitsu, Hideki Hirori. Spin switching in Sm0.7Er0.3FeO3 triggered by terahertz magnetic-field pulses. Nature Materials. 2025
- Ayano Nishizawa, Moe Otosaka, Toru Matsuura, Takehiro Tachizaki. Optical and Optoacoustic Inspection of Niobium Trisulfide Whiskers. The Journal of Physical Chemistry C. 2024
- Takehiro Tachizaki, Jeremy J. Baumberg, Osamu Matsuda, Motonobu Tomoda, Hirotsugu Ogi, Oliver B. Wright. Spectral analysis of amplitude and phase echoes in picosecond ultrasonics for strain pulse shape determination. Photoacoustics. 2023. 34. 100566-100566
- Takehiro Tachizaki. 3.8-octave broadband nearfield generation with high stability and high tolerance using a gradually varying thickness thin-film waveguide. AIP Advances. 2022. 12. 5
- Takehiro Tachizaki, Kan Hayashi, Yoshihiko Kanemitsu, Hideki Hirori. On the progress of ultrafast time-resolved THz scanning tunneling microscopy. APL Materials. 2021. 9. 6
- 佐成晏之, 齊藤雄太, 立崎武弘, 田中耕一郎, 富永淳二, 長谷宗明, 廣理英基. 高強度THz電場パルスが誘起するアモルファスGe2Sb2Te5の結晶化と成長機構. 日本物理学会講演概要集(CD-ROM). 2018. 73. 1
- 佐成晏之, 立崎武弘, 立崎武弘, 齊藤雄太, 牧野孝太郎, FONS Paul, KOLOBOV Alexander V., 富永淳二, 田中耕一郎, 田中耕一郎, et al. 高強度THz電場パルスによるGe2Sb2Te5の1次元的結晶成長機構の解明. 応用物理学会秋季学術講演会講演予稿集(CD-ROM). 2018. 79th
- 佐成晏之, 立崎武弘, 立崎武弘, 齊藤雄太, 牧野孝太郎, FONS Paul, KOLOBOV Alexander V., 富永淳二, 田中耕一郎, 田中耕一郎, et al. 高強度THz電場による相変化材料におけるゼナートンネリング誘起結晶成長の解明. 日本物理学会講演概要集(CD-ROM). 2018. 73. 2
- Generation of broadband mid-infrared laser and their applications to spectroscopy. 2017. 36. 7. 101-104
- 佐成晏之, 齊藤雄太, 齊藤雄太, 内田健人, 立崎武弘, 田中耕一郎, 富永淳二, 富永淳二, 長谷宗明, 長谷宗明, et al. Structural change of amorphous Ge<sub>2</sub>Sb<sub>2</sub>Te<sub>5</sub> induced by strong THz electric field. Optics & Photonics Japan講演予稿集(CD-ROM). 2017. 2017
- Defect detection method and defect detection device and defect observation device provided with same
- Defect detection method and defect detection device and defect observation device provided with same
- 走査プローブ顕微鏡のカンチレバー及びその製造方法、並びに熱アシスト磁気ヘッド素子の検査方法及びその装置
- 走査プローブ顕微鏡およびこれを用いた測定方法
- Scanning Probe Miscroscope
- 博士(工学) (北海道大学)
- 2019/11 - 現在 RIKEN Center for Emergent Matter Science Visiting Researcher
- 2014/04 - 現在 Tokai University School of Engineering Senior Assistant Professor
- 2018/10 - 2020/04 Kyoto University Institute for Integrated Cell-Material Sciences Visiting Senior Assistant Professor
- 2012/04 - 2014/03 Keio University Department of Physics Assistant Professor
- 2007/04 - 2012/03 HITACHI Ltd. Yokohama Research Laboratry Researcher
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- 2023/03 - Paper Award Low-background tip-enhanced Raman spectroscopy enabled by a plasmon thin-film waveguide probe
- 2021/05 - 公益財団法人発明協会 全国発明表彰 発明賞 新型瞳フィルタによるウェーハ欠陥検出装置の高感度化の発明
- 2019/10 - 発明協会 関東地方発明表彰 発明奨励賞 光学顕微鏡付き半導体欠陥レビューSEM
- 2014/07 - R&D Magazine 2014 R&D100 Plasmon-Excitation Optical Scanning Probe Microscope (Optical SPM)
- 2011/07 - R&D Magazine 2011 R&D100 Picometer-Resolution Quantitative Metrology Atomic Force Microscope
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SPIE: The international society for optics and photonics
, Optica (formerly The Optical Society of America)
, レーザー学会
, 応用物理学会
※ Researcher’s information displayed in J-GLOBAL is based on the information registered in researchmap. For details, see here.
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