S Ichimura, K Nakamura, A Kurokawa, H Itoh, K Koike. Growth mechanism of SiO2 ultra-thin film on Si(100) by highly concentrated ozone supplied at low and high pressure conditions. PHYSICS AND CHEMISTRY OF SIO2 AND THE SI-SIO2 INTERFACE - 4. 2000. 2000. 2. 67-77
Silicon Oxidation by Ozone: Its Reaction with a Precursor Molecule during Overall Process
(3rd International Conference on Emerging Advanced Nanomaterials (ICEAN 2018) 2018)
Photoelectron detection from transient species in organic semiconducting thin films by dual laser pulse irradiation
(The 8th International Symposium on Surface Science (ISSS-8) 2017)
Development of two photon photoelectron yield spectroscopy
(20th International Vacuum Congress (IVC-20) 2016)
Production and Detection of OH Species by a Highly Concentrated Ozone Gas for Thin Film Processing
(12th International Conference on Atomically Controlled Surfaces, Interfaces and Nanostructures in conjunction with 21st International Colloquium on Scanning Probe Microscopy (ACSIN-12 & ICSPM21) 2013)
Education (3):
1988 - 1990 University of Tokyo School of Science Department of Chemistry
1986 - 1988 University of Tokyo Faculty of Science Department of Chemistry
1983 - 1986 University of Tokyo College of Arts and Sciences Natural Science Stream II
Work history (11):
2022/04 - 現在 AIST Res Inst Measurement and Analytical Instrumentation Leader, Applied Nanoscopic Measurement Group
2021/04 - 現在 AIST TIA Central Office Staff Member, Open Research Facilities Station
2020/04 - 2022/03 AIST Res Inst Measurement and Analytical Instrumentation Chief Senior Researcher, Applied Nanoscopic Measurement Group
2015/08 - 2021/03 AIST TIA Central Office Staff Member, Open Research Facilities Station
2015/04 - 2020/03 AIST Res Inst Measurement and Analytical Instrumentation Leader, Nanospectroscopic Measurement Group
2016/05 - 2018/03 National Institute of Advanced Industrial Science and Technology
2013/05 - 2015/03 National Institute of Advanced Industrial Science and Technology
2010/10 - 2013/04 National Institute of Advanced Industrial Science and Technology
2005/04 - 2006/03 National Institute of Advanced Industrial Science and Technology
2001/04 - National Institute of Advanced Industrial Science and Technology (AIST)