Special Issue Molding and effect of grinding wheel and polishing pad; Relationship between microscale circulation flow of slurry and material removal rate in CMP. Journal of the Japan Society for Abrasive Technology. 2023. 67. 2. 79-82
DOI Toshiro, HIYAMA Hirokuni, FUKUDA Akira, KUROKAWA Shuhei. Trend of Semiconductor Devices and Planarization Technology with Future Development. Journal of the Japan Society for Precision Engineering. 2007. 73. 7. 745-750
Visualization of Slurry Flow between Polishing Pad and Wafer in CMP (5th Report) Relationship between removal rate and slurry circulation flow in glass CMP
(2024)
Development of Simulation Method for Material Removal Rate Distribution Considering Slurry Polishing Ability
(The 18th International Conference on Planarization/CMP Technology 2023 2023)
Relationship between removal rate and slurry flow in glass polishing
(2021)