Asahiko Matsuda, Takashi Teramoto, Takahiro Nagata, Dominic Gerlach, Peng Shen, Shigenori Ueda, Takako Kimura, Christian Dussarrat, Toyohiro Chikyow. NF3 and F2 gas fluorination of GaN surface and Pt/GaN interface analyzed by hard X-ray photoelectron spectroscopy. Applied Surface Science. 2024. 659. 159941-159941
Takashi Onaya, Toshihide Nabatame, Takahiro Nagata, Kazuhito Tsukagoshi, Jiyoung Kim, Chang-Yong Nam, Esther H.R. Tsai, Koji Kita. Effects of oxidant gas for atomic layer deposition on crystal structure and fatigue of ferroelectric HfxZr1-xO2 thin films. Solid-State Electronics. 2023. 108801-108801
Akito Fukui, Keigo Matsuyama, Hiroaki Onoe, Shun Itai, Hidekazu Ikeno, Shunsuke Hiraoka, Kousei Hiura, Yuh Hijikata, Jenny Pirillo, Takahiro Nagata, et al. Unusual Selective Monitoring of N,N-Dimethylformamide in a Two-Dimensional Material Field-Effect Transistor. ACS Nano. 2023
Ibrahima Gueye, Yasuhiro Shirai, Takahiro Nagata, Takashi Tsuchiya, Dhruba B. Khadka, Masatoshi Yanagida, Okkyun Seo, Kenjiro Miyano, Osami Sakata. Analysis of Iodide Transport on Methyl Ammonium Lead Iodide Perovskite Solar Cell Structure Through Operando Hard X-ray Photoelectron Spectroscopy. Chemistry of Materials. 2023. 35. 5. 1948-1960
Takashi Onaya, Toshihide Nabatame, Takahiro Nagata, Kazuhito Tsukagoshi, Jiyoung Kim, Chang-Yong Nam, Esther H. R. Tsai, Koji Kita. Role of Interface Reaction Layer between Ferroelectric Hfxzr1-Xo2 Thin Film and Tin Electrode on Endurance Properties. 2023
2013/10 - 応用物理学会 The 74th JSPS Autumn Meeting, 2013, Poster Award Anisotropic growth of ZnO nanorods and their electrical properties
2011/12 - Materials Research Society Outstanding Poster Award (2011) Oxygen migration at Pt or Cu/HfO2 interface under bias operation: oxide based ReRAM application